Used ELECTROGLAS / EG 2001X #293749343 for sale

ELECTROGLAS / EG 2001X is a state-of-the-art prober designed for advanced testing and probing of semiconductor wafers and devices. This prober offers several unique and advanced features that set it apart from other probers on the market. It is capable of working with a variety of substrates, including silicon, Silicon-on-Insulator (SOI), and other alternative materials. Additionally, it supports 4 types of probe cards: vertical, laser, Z-axis, and manual. The prober features a scanning rate of 21,200 wafer tests per second and a batch size of 200 wafers per hour. It has a maximum acceleration of 9 m/s2 and a maximum scanning speed of 8m/s2. It also offers a rapid head positioning equipment and automated wafer handling system. This allows the prober to quickly change between different substrates and shift between different test positions with precision. In terms of electronic measurement, EG 2001 X utilizes an advanced channel amplifier to provide an accurate measurement of the I-V curve of up to 4 different signal ranges and up to 8 different test parameters. This enables the prober to detect subtle signal changes, such as analog scan mismatches, signal drift, signal noise, dynamic signal changes, and process changes. At the same time, the prober offers a versatile software architecture that enables users to customize their set-up, which simplifies and streamlines the testing process. Its GUI control unit provides users with a simple, intuitive way to use and fine-tune the software. In short, ELECTROGLAS EG2001X is a highly advanced prober renowned for its fast scanning rate, efficient wafer handling machine, and versatile software customization. This prober is perfect for advanced testing and probing of semiconductor wafers and devices.