Used ELECTROGLAS / EG 2001X #293758536 for sale

ELECTROGLAS / EG 2001X is a wafer probing equipment designed to deliver fast, reliable performance in high-density, high-speed complex wafer probing. This prober is capable of probing wafers up to 200 mm (7.87") in diameter with a 20-micron accuracy. It uses advanced features like automated site recognition, extensive wafer mapping, and automatic alignment to ensure precise probing of wafers of all architecture designs. The automated site recognition feature enables the system to identify each circuit site on a wafer, allowing the tool to accurately locate the sites, even when the site address is not visible. The wafer mapping feature helps locate contact targets without any visual indication, while the automated alignment feature allows the unit to align the contactors accurately to targets on the wafer. EG 2001 X can be interfaced with digital probing fixtures, multi-site, and multi-function dicing machines. The innovative controller design of ELECTROGLAS EG2001X provides enhanced accuracy, throughput, and reliability in all types of wafers. It operates with dual mechanized XY axes, achieving rapid throughput for even the most complex test plans. The multi-axis controller supports dual simultaneous motion for wafer mapping and test site addressing, greatly increasing overall capabilities. By utilizing a high-speed digital architecture, the prober enables fast data processing. The machine also offers an advanced software package that allows users to customise the probing operations according to their specific requirements. ELECTROGLAS / EG EG2001X offers many different versions for both manual and robotic probing operations, such as a programmable multi-axis controller for robotic operation, as well as a controller for manual probing. Furthermore, the tool provides user friendly interface for operation and programming. The operator station offers an intuitive graphical user interface to control the asset. The customizable probe control options allow the user to select the most efficient method for each task. The model also allows integration with external PC measurement systems for increased accuracy and speed. ELECTROGLAS / EG 2001 X is a high-performance prober designed to meet the demanding needs of semiconductor technologies. It offers reliable, precise, and fast probing operations for a variety of wafer probing requirements. It is an effective and efficient tool in controlling circuit pattern probing, and serves as the ideal solution for a variety of wafer probing applications.