Used ELECTROGLAS / EG 2001X #82849 for sale

ELECTROGLAS / EG 2001X is an automated prober designed to provide cost-effective, high-volume wafer probing on 200mm and 300mm wafers. It utilizes a patented low force, true contact technology for accurate and efficient electrical testing of the wafers. The equipment is programmed by a very intuitive user interface, with a Windows-based graphical user interface (GUI) providing quick and easy test program setup, troubleshooting, and control. The prober can accommodate wafer sizes from 4" to 12", and can reach wafer temperatures up to 150°C. It can also handle probe cards up to 420 mm in length, allowing for a variety of sensing capabilities. The prober is equipped with a flexible X-Y stage which can move quickly without sacrificing accuracy. It has an advanced vision system which performs accurate and repeatable alignment of fiducials and dies. It uses an advanced probing head with 12 DOF (degrees of freedom) that is capable of adjusting its own flight plan. This allows the prober to adapt to changing conditions and improve test coverage with each wafer. The unit also has a built-in offset compensation capability, which can correct any misalignment from max to min as well as two-axis wafer slip correction. EG 2001 X offers advanced software features for process control and automation. It is equipped with AutoCalibration software for constant maintenance of the optimum probing conditions. It can also support multiple data files and multiple part types, allowing for fast switching between wafer runs and different test requirements. The prober can be connected to an Ethernet network for remote control and monitoring of the equipment, and the user interface is fully compatible with Windows-based systems. ELECTROGLAS EG2001X is a highly efficient and accurate prober that can provide a cost-effective automated solution for large-scale semiconductor wafer probing. Its user-friendly interface, advanced vision machine, and flexible stage make it an ideal choice for high-volume wafer testing, while its AutoCalibration feature provides automatic maintenance of optimal probing conditions. The prober's network connectability ensures that it is always connected to the users' requirements, simplifying overall management of the tool.