Used ELECTROGLAS / EG 2001X #83735 for sale

ELECTROGLAS / EG 2001X Prober is an advanced, versatile, and highly sophisticated prober equipment specifically designed for use in the testing, characterization and probing of sophisticated semiconductor devices, circuits, and modules. It has a large, wafer-level, color touch panel display, which makes it easy to operate and monitor. The Prober is built on a heavy duty stainless steel base, providing both a highly rigid structure and EMI/RFI shielding for optimum accuracy and repeatability. It is equipped with an intelligent, multi-axis motion platform that is capable of accurately transporting the proding head with extremely high speeds, ensuring that each test probe placement is precise and repeatable, time after time. EG 2001 X Prober is designed to provide high speed, automated prober handling with versatile on-wafer automatic probing and coarse-fine alignment, and high-precision wafer chuck positioning system. It is capable of probing wafers ranging in size from 50 - 200mm using a variety of probe cards, as well as a wide range of die sizes. The prober is also equipped with several advanced features, including real-time screening and analysis capability, a high-precision edge finding unit, and a tool to efficiently control the probing procedure. It has an array of configurable test terminals that provide access to external electromagnetic test instruments, allowing the user to accurately and quickly measure and characterize wafers. The prober is highly modular and user-friendly, allowing users to quickly access, configure and deploy the desired prober configurations and functions. The prober machine comes equipped with an Ethernet port for remote and automated control, with support for both wired and wireless connections, making it easy to integrate and control from any location. Developed for the industrial-grade testing environment, ELECTROGLAS EG2001X Prober offers superior accuracy, repeatability, speed, flexibility, and cost-effectiveness for continuous and precise wafer probing in both production and process engineering environments.