Used ELECTROGLAS / EG 2001X #9088269 for sale

ELECTROGLAS / EG 2001X is a powerful prober for semiconductor wafer testing and fabrication. It is a high-performance wafer testing and probing solution that uses advanced technology to maximize cost-effectiveness and yield results with maximum accuracy and speed. EG 2001 X is a fully automated probe station with a maximum probing area of 11 x 11 inches. It features a motorized X-Y stage with a 75mm Z-axis movement and a high-force 0-200gram Z-axis force feedback equipment. The station has an optimized low-noise floor with a TTL/DC-level signal integrity protection system that improves signal quality in high-noise environments. ELECTROGLAS EG2001X is also equipped with a high-speed E-beam alignment unit that provides fine-line wafer alignment accuracy. It also features a patented power-based wafer lifetime estimator and has a fully automated calibration procedure. The station is constructed with a temperature compensated steel frame which minimizes warping in harsh environments, and features flexible probing solutions to meet specific application needs. The probe station is fitted with a range of ball tip probes and uses advanced software to customize the probing limits, while providing accurate feedback. The probes can also be calibrated with a multi-point linearity algorithm to ensure maximum accuracy and repeatability of results. ELECTROGLAS / EG EG2001X also integrates a precision optical setpoint alignment machine allowing probe tips to be accurately aligned to nanometer scribe lines for fast and accurate probing on thick wafers. EG EG2001X offers a full range of advanced testing options including fault analysis, embedded test, ON and OFF testing and characterization. It is also equipped with an optional mini-robot for MEMS device test and high-volume probing. The tool is capable of providing automated wafer probing solutions, as well as multi-wafer probing solutions for high-volume applications. In addition, ELECTROGLAS 2001X is integrated with a high-speed time-domain reflectometer, which provides accurate and reliable measurement of waveforms at gigahertz frequencies with nanosecond resolution. This feature is useful for analyzing digital, analog and mixed-signal waveforms, helping to reduce test times and cost of test. Overall, EG2001X is an efficient and reliable prober for wafer testing and probing. It is equipped with cutting-edge technologies such as a E-beam alignment asset, a precision optical setpoint alignment model, a TTL/DC-level signal integrity protection equipment, a high-speed time-domain reflectometer and an optional mini-robot. These features, coupled with a comprehensive range of testing options, make 2001 X an ideal solution for high-demand semiconductor testing and probing applications.