Used ELECTROGLAS / EG 2001X #9116523 for sale

ELECTROGLAS / EG 2001X is a prober designed specifically for wafer-level electrical network testing. It features a multi-port interface and a large sample chamber to accommodate multiple device sizes. The frequency range is up to 40 GHz with an automatic calibration feature for use in fine-pitch or mixed-technology substrates. The probe card that drives EG 2001 X is made up of two separate assemblies. The main assembly is mounted to the base and holds the contactors and meshing rings in place. The secondary assembly is a contactor/tip holder that sits above the main assembly. The multi-port interface is configured for up to 25 test probes. Each probe can be adjusted to provide the desired working range, and the piercing needles can be set to accommodate different types of meshes. ELECTROGLAS EG2001X works with a variety of pogo-pins for a range of device sizes and pin counts. It can also be used with a variety of test equipment and generator cards, maximizing the flexibility of the setup. The probe card holder on ELECTROGLAS 2001 X is adjustable, allowing for fine-tune adjustments of the probe contact on the probes coming from the test system or wafer handler. Its optional high speed tunnel tool helps speed up test times and optimize results. ELECTROGLAS / EG EG2001X is designed to work with advanced software packages and to be integrated into a production testing system. It is built with a specific software package and supports vector-based high-speed test patterns and advanced failure analysis. Its support for JTAG and high-frequency testing makes it versatile enough for a variety of industries, such as automotive, consumer electronics, and medical electronics. The large sample chamber allows for multiple device sizes to be tested and the user to quickly select between probe cards without having to adjust the probe itself. It is a reliable system that provides a cost-effective solution for wafer- and substrate-level testing.