Used ELECTROGLAS / EG 2001X #9155072 for sale
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ID: 9155072
Prober
Table: High
Operating system: Prober vision,DA (Disk)
Ring carrier: RC-2
Profiler: piston
Microscope: Olympus SZ-30
Chuck top: 6 Inch gold-ambient
Align camera: Cohu-zoom
Z Stage: PZ-150, 0.5-mil
DAR Resolution: Low
Handler type: 6 Inch belt track
Vision module: Cognex PRM-2
Power requirement: 220 Vac
Air requirement: 80 psi
Vacuum requirement: 18 Inch Hg.
ELECTROGLAS / EG 2001X Prober is a high-performance parallel, automated test equipment that is designed for semiconductor wafer prodding and probing operations. It is a reliable and cost-efficient tool, designed to handle a wide range of prodding tasks, including wafer probe testing and parametric monitoring. EG 2001 X is perfect for the latest generation, high-performance semiconductor technologies. The prober offers advanced scanning capability, comprehensive motion control, flexible prodding, and adaptive motion control. It is equipped with a control interface with intuitive graphical user interface (GUI), a wide range of prober options, and a fully automated operation. The system's motion control feature allows it to be used in various probing applications, from automatic testing of fully-stacked wafers to medium-pin penetration and 3-C probe capabilities. The motion control is also capable of providing accurate and repeatable positions of both the probe force and the wafer stub. ELECTROGLAS EG2001X Prober's scanning features can be customized to individual needs, and include multi-stage scanning, perpendicular scanning, and rake scanning capabilities. Additionally, it offers built-in electrical calibration features for increased accuracy. The unit is equipped with an accelerated prober accuracy of 4 microns, and can be used for various types of IC and optoelectronic devices. The sophisticated design of the machine offers several other features such as auto-leveling support, automatic chip trace and correction, user-defined pile-up detection, high-speed signal and DC analysis, and an array of conveniently accessible external ports for controlling multiple functions. 2001X Prober also has an extremely efficient tool configuration, allowing the user to configure the asset to maximum efficiency for every application. In addition, the prober is also equipped with an embedded, high-performance rework model for repair and rework of defective ICs. In addition, the equipment offers professional maintenance, data monitoring, imaging, and printing functions for convenient and efficient data acquisition and analysis. The efficient and reliable ELECTROGLAS 2001X Prober is a versatile and economical testing tool for the latest generation of semiconductor technologies. Its comprehensive features and functions make it a valuable asset for semiconductor manufacturers.
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