Used ELECTROGLAS / EG 2001X #9155110 for sale

ELECTROGLAS / EG 2001X
Manufacturer
ELECTROGLAS / EG
Model
2001X
ID: 9155110
Prober Table: High Operating system: Prober vision.DF (Eprom) Ring carrier: RC-2 Profiler: Piston Microscope: Olympus SZ-30 Chuck top: 6 Inch gold-ambient Align camera: cohu - black Z Stage: PZ-150, 0.5-mil DAR Resolution: High Handler type: 6 Inch belt track Vision module: Cognex PRM-2 Power requirement: 220 Vac Air requirement: 80 psi Vacuum requirement: 18 Inch Hg.
ELECTROGLAS / EG 2001X is a wafer prober used in the semiconductor industry for testing electrical characteristics of integrated circuits. It is an advanced wafer probing equipment that utilizes a state-of-the-art design to overcome electrical, mechanical and thermal challenges. Features like uniform die loading, fine particle protection and improved monitorability enable it to achieve high test precision and yield. EG 2001 X feature an Advanced Travel Mechanism that consists of a high-precision, dual-magnetic linear motors and slip-free design. This reduces the yield-reducing perturbation caused by the contact force when the mechanical motion of the prober transitions to the electrical measurement. Uniform die loading is provided through the use of tungsten contact forces, ensuring consistent pressure and contact during the probe process. ELECTROGLAS EG2001X is also equipped with a precision mapping system for thermocouple placement. This ensures tight temperature regulation by optimizing the placement of workhead temperature-sensing elements to distribute thermal loading more evenly. This helps to maintain unit stability and improve limited operating ranges in which low-power chips are tested. EG EG2001X is protected from electrostatic discharge (ESD) with a conductive epoxy surface, reducing damage to electrical components. Furthermore, advanced monitoring capabilities ensure that the machine is working optimally during the entire testing process. This combines with a sophisticated data logging tool that allows for detailed analysis of test results. In addition, advanced circuit testing features are included for advanced process control. These features include device isolation and parametric test capabilities that allow for deeper insight into product yield and trends. In summary, EG 2001X is an advanced wafer prober that provides superior test precision and yield through its cutting-edge design and performance features.
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