Used ELECTROGLAS / EG 2001X #9155114 for sale

ELECTROGLAS / EG 2001X prober is a high-performance, non-contact testing tool designed for use in wafer probing and planarization. It is a fully automated testing equipment that is specifically designed for precise and accurate handling of wafers during complex test procedures. EG 2001 X prober was developed to provide a reliable, efficient, and effective testing solution for various types of wafers, including single- and multi-die wafers, MEMS and NAND devices, and HV (High Voltage) devices. It offers a variety of features to facilitate efficient testing and comprehensive analysis, including high-speed contact scanning, high-speed contactless scanning, and dynamic planarization. It is powered by an advanced vision system, which enables identification and automatic adjustment of the testing parameters for different chips, test boards, and sample substrates. The prober is also equipped with a number of robust and reliable features. It is capable of a variety of test cycles, including successive tests, parallel testing, and individual instructions. It also supports optimized wafer mapping for higher throughput, and manual adjustment of probing and testing parameters. The prober is fitted with a dual-axis articulating robotic arm, along with a high-resolution imaging unit, which is used to determine the precise wafer positioning prior to each test. The prober also features an intuitive user-interface, with a customizable touch-screen display and an integrated statistical analysis machine, making it easy to generate accurate and complete test results. Overall, ELECTROGLAS EG2001X prober is an efficient, reliable, and user-friendly testing tool that can be used to accurately identify and validate the performance and integrity of wafer devices. It provides optimal throughput, easy-to-use software, and exceptional wafer-handling capability, enabling fast and accurate probing and testing of wafer devices.