Used ELECTROGLAS / EG 2001X #9155115 for sale

ELECTROGLAS / EG 2001X
Manufacturer
ELECTROGLAS / EG
Model
2001X
ID: 9155115
Prober Table: High Operating system: Prober vision.DA (Eprom) Ring carrier: RC-2 Profiler: Piston Microscope: Olympus SZ-30 Chuck top: 6 Inch gold-ambient Align camera: Cohu - zoom Z Stage: PZ-150, 0.5-mil DAR Resolution: Low Handler type: 6 Inch belt track Vision module: Cognex PRM-2 Power requirement: 220 Vac Air requirement: 80 psi Vacuum requirement: 18 Inch Hg.
ELECTROGLAS / EG 2001X prober is an automated device used to test and analyze the electrical characteristics of semiconductor wafers. This prober is used in the quality assurance and reliability testing of integrated circuits and wafers. It provides accurate results with high repeatability and reliability for complex testing and probing of a wide range of devices. The design of EG 2001 X prober is based on the modular construction of its optical equipment, providing versatility and flexibility. This system consists of an optical head, a lens assembly, and a controller. The optical head can move a wide range of probes in the x, y, and z axes of a two-dimensional plane. It has an integrated motorized microscope and motorized focus that can be adjusted automatically to obtain an optimum focus. The probe holder can support a wide variety of probes designed for different testing scenarios, and the motion can be controlled with digital and analog commands. The lens unit of ELECTROGLAS EG2001X prober uses advanced optical components and design principles to provide maximum clarity, computer-controlled image restoration and magnification adjustment, and zoom capability. The controller consists of an microprocessor-based machine which can control all the prober's aspects, including motion, signal acquisition, data storage and analysis, and report generation. An external user interface can be used to interact with the prober and program tests and analyze results. ELECTROGLAS / EG EG2001X prober can be used to analyze a variety of parameters, such as conducting characteristics, resistance, capacitance, leakage current, and thermal effects. Measurements and data of each parameter can be displayed clearly on the tool's interactive user interface. Additionally, the operator can access and edit the prober's functions, such as movement, scanning, parameter setup, measurement, and data logging. Overall, ELECTROGLAS 2001 X prober is well-suited for applications such as high-volume production testing, process monitoring, and research and development work. Its optical asset, controller, and user interface give it the ability to accurately measure and analyze a wide sample types with precision and accuracy.
There are no reviews yet