Used ELECTROGLAS / EG 2001X #9155120 for sale

ELECTROGLAS / EG 2001X Prober provides a comprehensive set of micro-electronic test and probing capabilities. This system offers high-value operation and configuration, enabling complete characterization and complex testing on delicate ICs to yield precise failure analysis. EG 2001 X Prober is designed to maximize the return on investment. It maximizes speed and accuracy while keeping up with rapid changes in technology. The prober enhances usability and reliability with full software control, an intuitive graphical user interface, and ergonomic design. The powerful in-chuck controller minimizes signal crosstalk while operating from a single connection. It features accurate servo motion control to ensure precise tip placement and probe-to-flame contact. Both 50 and 100 TPI probes are supported, with enhanced tip protection to extend life for years of reliable operation. Equipped with 20 channels, the prober supports a variety of testing using TestJet, TLA, fixed and movable probes, WaferJet, and custom sine waves. In addition, ELECTROGLAS EG2001X offers 50Ghz probe amplification with high accuracy, high speed measurements, and datalogging capabilities. Data capture and analysis functions permit dynamic process optimization. Advanced timing functions allow fast loop and step testing. The prober's high-speed data acquisition channel can capture both fast and slow signals. The analysis board provides detailed diagnosis of probed nodes, current and voltage tests, waveform monitoring, and AC/DC parameter measurement. ELECTROGLAS 2001X Prober provides multi-site testing capabilities including custom timing pins, scanning of burst pulses, custom tests, and automatic number recognition. The prober also features full-featured analysis functions including histograms, statistical tests, automated vector mapping, and cycle/program timing. Protocols and automation are enhanced with the integrated programmitter. It supports JEDEC, Silicon Connector, TLA3000, and WaferJet communication formats in order to maximize test coverage. 2001X Prober provides automated device programming and a flexible platform for precise fault isolation--all at higher throughput.