Used ELECTROGLAS / EG 2001X #9155121 for sale

ELECTROGLAS / EG 2001X prober is a computer-controlled semiconductor probing and testing equipment. It is an automated system that provides high-precision probing for electrical characterization and failure analysis in the development, production, and the field service of semiconductor devices. The unit is ideal for use in advanced IC and MEMS devices, as it provides a high degree of accuracy and repeatability. EG 2001 X prober features a comprehensive suite of hardware and software options for comprehensive device probing and precise testing. It is capable of a wide variety of techniques, such as wafer probing, test jigs, pick-and-place testing, and contactless testing. The prober's advanced scanning array microscope enables fast and accurate image acquisition for location and fault diagnosis. The machine is equipped with an ultra-fast and automated calibration tool for quick and accurate probing of unknown circuitry. The probe head can be set up to support high-density probing and provide up to 100nm probing resolution. The automated voltage offset measurement asset helps to detect device response to probing, providing feedback on the accuracy of the scan. The model features a patented fast algorithm for rapid and accurate electrical test generation and analysis. Integrated software interfaces provide comprehensive control and analysis tools, with full support for scripting, data storage, and post-processing. Easy configuration options such as multi-device test set-up, branching, looping, and stepping allow for quick and easy optimization of test program accuracy. ELECTROGLAS EG2001X prober features an easy-to-use GUI interface and intuitive commands for enhanced usability. The equipment is designed for efficient and reliable operation in a wide range of laboratory and industrial environments. It provides operators with a comprehensive suite of diagnostics, test result validation, program management, and data storage capabilities.