Used ELECTROGLAS / EG 2001X #9155123 for sale

ELECTROGLAS / EG 2001X
Manufacturer
ELECTROGLAS / EG
Model
2001X
ID: 9155123
Prober Table: High Operating system: Prober vision.DA (Eprom) Ring carrier: RC-2 Profiler: Piston Microscope: Olympus SZ-40 Chuck top: 6 Inch gold-ambient Align camera: Cohu - black Z Stage: PZ-150, 0.5-mil DAR Resolution: Low Handler type: 6 Inch belt track Vision module: Cognex PRM-2 Power requirement: 220 Vac Air requirement: 80 psi Vacuum requirement: 18 Inch Hg.
ELECTROGLAS / EG 2001X Prober is a precision test equipment designed for use in component engineering, semiconductor wafer fabrication, or any other automated test environment. EG 2001 X offers superior performance and repeatability across the entire testing process. ELECTROGLAS EG2001X includes a robotic arm that offers a range of motions for precise placement and handling of devices for probing and measurement. The up and down motion of the arm allows for placement of devices from a palette onto a tester. It also has a scanning motion to cover the entire wafer in a single pass. EG EG2001X's state-of-the-art wafer handling system and Dual Actions cassettes provide rapid wafer change-over and offers convenience of handling multiple probe cards. EG2001X is designed with an advanced measurement unit, with its proprietary digital-to-analog conversion technology providing the highest signal integrity in the industry. It also includes an on-board, high-speed waveform generator with an on-board signal conditioner for precise, repeatable measurement of device characteristics, while its open architecture permits easy connectivity to most tester, programming, and control systems. EG 2001X is also designed with a 3-axis linear servo-motor machine to provide consistent, repeatable positioning of the probe card during probing operations. Its compact, enclosed cabinet includes a hood for isolating environmental contaminants and preventing foreign objects from entering. Plus, its precision alignment tool allows for accurate, repeatable placement of the probe card across all axes. ELECTROGLAS / EG EG2001X provides an easy-to-use, automated test solution that can effectively probe with both fine-pitch and opto-mechanical technology. It offers superior control for device probing and characterization, and its reliability and precision makes it the ideal test asset.
There are no reviews yet