Used ELECTROGLAS / EG 2001X #9155126 for sale
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ID: 9155126
Prober
Table: High
Operating system: Prober vision.CE (Eprom)
Ring carrier: RC-1
Profiler: Piston
Microscope: Olympus SZ-30
Chuck top: 6 Inch gold-ambient
Align camera: Cohu -black
Z Stage: PZ-150, 0.5-mil
DAR Resolution: Low
Handler type: 6 Inch belt track
Vision module: Cognex PRM-2
Power requirement: 220 Vac
Air requirement: 80 psi
Vacuum requirement: 18 Inch Hg.
ELECTROGLAS / EG 2001X is a high-speed, multi-functional prober equipment designed for modern wafer probing and testing. It offers a wide range of capabilities, including: non-contact scanning, high-precision motion capability, high speed data acquisition, advanced metrology solutions, and real time feedback. The system features a three axis wafer positioner with a range of 0.007um, making it capable of precise positioning. The prober's nanometer-level resolution also offers excellent accuracy for both scanning and positioning. An integrated high-resolution, 3-axis linear encoder provides real-time feedback of wafer position and motion. EG 2001 X achieves fast automated scanning with a maximum sample rate of 200kHz. It incorporates an electrically programmable field of view with a range of 0.01 to 1000mm. This makes the prober suitable for a wide variety of applications such as the inspection and validation of wafers, semiconductor components, and printed circuit boards. The unit is equipped with powerful metrology software that enables users to easily verify wafer and component's profile, position, size, and distances. The software also offers full traceability for wafers, components, and pcb schematics, helping to ensure that the machine is compliant with industry standards. ELECTROGLAS EG2001X supports the connection of multiple types of probe cards, offering a variety of probes that can be used for different types of tests. The tool is highly expandable, allowing for additional accessories and peripherals to be connected. The software is user-friendly and allows users to customize their settings, observe real-time process feedback, and ensure repeatability and accuracy. Overall, EG2001X is an excellent prober asset that offers highly accurate scanning and positioning capabilities, fast data acquisition, and comprehensive metrology software. It is designed to meet the requirements of a wide range of applications. With its user-friendly software and expandability, the prober model is an ideal solution for semiconductor and PCB testing.
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