Used ELECTROGLAS / EG 2001X #9155127 for sale

ELECTROGLAS / EG 2001X is a fully automated high precision wafer prober designed for the testing of silicon chips and die. It uses a base plate that is suspended between two linear stages, each independently driven with an automated system. This enables the prober to accurately position a needle-like probe with pinpoint accuracy across the surface of the wafer at the specified probing parameters. The linear stages have override controls in order to provide a manual override of the automated operations. The prober is equipped with a video display and can be programmed to provide custom automated test and probing. It has a camera mounted to the base plate in order to automatically recognize and identify chips and die on a wafer, saving time consuming manual alignment tasks. The prober features a manual and automated zoom that enables to obtain high magnification views of specific parts of the wafer. Additionally, its computer controlled, easy to use software is designed for both first time and experienced operators and allows to set up, control and monitor its operations. EG 2001 X is manufactured with the latest robust components and engineering to ensure reliability and performance. It is designed to accommodate a variety of probing systems and chips, and is engineered to services a vast range of semiconductor tasks such as testing integrated circuits, performing wafer-level characterization and probing multi-chip modules. The prober is fitted with safety measures, including a protecting mechanism against accidental damage caused by shocks or vibration. Moreover, noise levels are low enough for the operation of human workers. Additionally, the HIGH/LOW option provides the flexibility of a single-stage prober configuration while still being able to retain the highest probing accuracy, in order to guarantee uniform probing results. Overall, ELECTROGLAS EG2001X prober guarantees the highest resolution and accuracy for wafer manipulation and probe operations. It is ideal for High-Volume Manufacturing (HVM), as it provides high speed wafer testing for batch production. Furthermore, this sophisticated robust prober is within reach of a wide range of budgets.