Used ELECTROGLAS / EG 2001X #9155129 for sale
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ID: 9155129
Prober
Table: High
Operating system: Prober vision.CE (Eprom)
Ring carrier: RC-2
Profiler: Piston
Microscope: Olympus 99
Chuck top: 6 Inch gold-ambient
Align camera: Cohu-zoom
Z Stage: PZ-150, 0.5-mil
DAR Resolution: Low
Handler type: 6 Inch belt track
Vision module: Cognex PRM-2
Power requirement: 220 Vac
Air requirement: 80 psi
Vacuum requirement: 18 Inch Hg.
ELECTROGLAS / EG 2001X prober is an advanced wafer-testing equipment designed for probing with high accuracy. It is capable of executing complex testing sequences with rapid throughput, making it an essential part of the integrated circuit (IC) production process. EG 2001 X prober is an 8th generation system composed of a probe head, test head, vibration isolation unit and RF shields. The machine is equipped with high resolution optical encoders, providing accurate and repeatable probing on each test site, up to a resolution of under 1 micron. This makes the tool useful for testing advanced ICs, such as memory, analog and digital logic devices. The test head includes a mechanical library, which holds up to 16 PCBs or thin film substrates. Each PCB can hold up to 4500 devices. The test head also includes a computer control asset that can be interfaced with digital and analog test systems, as well as SMUs and RCUs, for high-speed and accurate probing. The probe head is designed to support all types of device packages. It includes up to 32 floating contactors that can be quickly changed, as well as eight force sensors with a sensing range up to 10 Newtons. The probe head also includes a full injection mix chamber with ejection capability, as well as a wafer break detector. The vibration isolation model reduces the displacement and force caused by vibration, shock, static charges and electrostatic discharges. Its patented design maintains a low-profile configuration that takes up minimal floor space and can be quickly reconfigured for production needs. ELECTROGLAS EG2001X prober is a highly reliable wafer-testing equipment, designed to improve test cycle times and yield rates while reducing test costs. The system includes a wide variety of features to provide accurate and repeatable probing on each test site, as well as vibration isolation and RF shielding for precise test results. It is an ideal solution for advanced IC testing in high-volume production environments.
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