Used ELECTROGLAS / EG 2001X #9155131 for sale

ELECTROGLAS / EG 2001X
Manufacturer
ELECTROGLAS / EG
Model
2001X
ID: 9155131
Prober Table: High Operating system: Prober vision.CE (Eprom) Ring carrier: RC-1 Microscope: Olympus 99 Chuck top: 6 Inch gold-ambient Align camera: Cohu-black Z Stage: PZ-150, 0.5-mil DAR Resolution: Low Handler type: 6 Inch belt track Vision module: Cognex PRM-2 Power requirement: 220 Vac Air requirement: 80 psi Vacuum requirement: 18 Inch Hg.
ELECTROGLAS / EG 2001X is a semi-automatic prober manufactured by EG, a provider of test solutions. It is ideal for testing a wide variety of devices quickly and accurately, offering a broad range of capabilities for probing, probing trays, wafer support systems, and sample handling. Its design is based on a reliable four-degree-of-freedom motion platform, enabling precision alignment and on-wafer probing accuracy. EG 2001 X has a programmable z-control that enables precise adjustment of probe-tip-to-device distance, as well as optimized mating and separation of samples. It supports both manual and computer-controlled operation, providing reliable, repeatable results. The platform can be configured for flexible tooling options with specialized force mechanisms, automation fixtures, and thermal systems for a wide range of test requirements. The device can be programmed to move in straight lines, performs linear interpolations, travel in an arc, and identify points with real-time processed data. It is also compatible with multiple vision systems for greater accuracy during wafer testing. The probe features a rigid cast iron construction to eliminate vibration and facilitate dependable on-wafer measurements. For efficient use and storage of test program data, ELECTROGLAS EG2001X features an online program editor with multiple program features. It also supports the production of a variety of test structures, eliminates the need for manual programming, and offers non-destructive testing capabilities. The prober can also control provide decentralized access to important test data and test programs, with safety features to ensure secure operations. EG EG2001X is designed for efficient testing with an intuitive graphical user interface and numerous features for programming, automated tests, coordinates, temperature and height adjustments, and much more. Its compatibility with a host of vision systems makes it ideal for advanced wafer testing applications. Its advanced optics and probing capabilities make it a reliable and efficient tester for high-volume production requirements as well as engineering and research labs.
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