Used ELECTROGLAS / EG 2001X #9171218 for sale

ELECTROGLAS / EG 2001X is an ATE-based prober used for wafer probing. This prober was introduced in the late 1990s and is still commonly used in semiconductor production today. It is an advanced, reliable and highly productive ATE system designed for both wafer and wafer-level probing. This system offers many capabilities to help engineers increase their throughput and yield while reducing downtime and reprocessing costs. It is designed to be compact, integrating the wafer and probe station into one frame, thus saving floor space. EG 2001 X has a range of powerful integrated capabilities, including a MEMS, Laser interferometer and ColorView. The MEMS offers high accuracy and repeatability, while the Laser Interferometer offers a high speed and accuracy for scanning operations. The ColourView displays a live image of the wafer and provides accurate color on a pixel-by-pixel basis. ELECTROGLAS EG2001X also offers a broad range of configurable options, including programmable XYZ motion, various wafer handling/presentation choices, a variety of probe heads for fine-pitch applications, as well as active contact tweezers for small signal measurements. Furthermore, probing is made easier with automatic die-to-probe alignment and die-to-die mechanisms, as well as calibration, operational and analytical tools. In addition to the advanced capabilities, 2001X has an intuitive user interface for fast testing setup. It also offers fast test time, with integration of automated test programs, accurate and repeatable connection to a wide variety of probes and long-term data logging for maximum system throughput. 2001 X is designed to meet the requirements of today's advanced, state-of-the-art semiconductor production and test environments. It provides a reliable and cost-effective solution for probing and testing various wafers, enabling engineers to quickly identify and troubleshoot any problems encountered during the production process.