Used ELECTROGLAS / EG 2001X #9171904 for sale

ELECTROGLAS / EG 2001X is a prober developed by EG, a manufacturer of facility solutions for semiconductor semiconductors. The machine is designed to inspect, measure, and test the electrical properties of semiconductor wafers and devices. The prober operates on a motorized stage and is equipped with multiple probes for contacting the samples. EG 2001 X features an automatic calibration that allows it to self-calibrate across three axes. This reduces the time required for manual calibration and ensures that precise measurements are made during the probing process. Additionally, the motorized staging system enables precise and automated movement of the probe to the desired testing points. This automation has shortened testing times and increases process reliability. ELECTROGLAS EG2001X is also equipped with advanced software packages for data acquisition and analysis. This feature allows users to graph the collected data and quickly scan through the test results. This allows users to analyze and troubleshoot results faster. Additionally, ELECTROGLAS 2001X supports Active Probing and Active Substrapping, which allows probes to become active and interact directly with the device under test. This feature also allows users to apply different stimuli and measure resulting voltages or currents. ELECTROGLAS / EG 2001 X has low noise transmission, making it suitable for use in very clean environments such as wafer fabrication facilities. It also has high accuracy and repeatability, allowing it to perform precise and reliable measurements. ELECTROGLAS / EG EG2001X is compatible with a wide range of probes and can interface with other test equipment such as oscilloscopes and digital multimeters. Overall, 2001 X prober is a reliable and powerful machine. Its automated calibration and advanced software make it a highly efficient tool for semiconductor testing, and its compatibility with a range of probes make it suitable for a wide variety of testing applications.