Used ELECTROGLAS / EG 2001X #9173641 for sale

ELECTROGLAS / EG 2001X wafer prober is a high-performance equipment designed for efficient probing and testing of large-scale integrated circuit (LSI) devices. Its modular construction makes it ideal for a wide range of production environments. The system features a rigid XY motion table, which provides precise, controlled motion to ensure accurate placement and testing of devices. The XY stage features optical and closed loop motors, providing repeatability in accordance with the requirements for ESD-sensitive device testing. The unit supports a variety of probe styles, including RJ45, needle, pogo, and liquid contact. It can also be used for device level probing. A comprehensive range of active and passive probe cards are supported, including active shielding measurement systems to minimize interference. The machine is capable of handling up to 11 inch (27 cm) wafers, making it suitable for large-scale production environments. The tool uses a patented tension arm design, which eliminates the need for manual tension adjustment and allows it to accurately and quickly probe wafers without human intervention. The asset is also equipped with an advanced vision model. This allows images to be captured and analyzed to ensure accurate placement of devices during testing. The equipment operates with a wide range of EDA software, making it suitable for a variety of applications such as chip characterization, production testing, and memory/system-level testing. It has a comprehensive suite of built-in measurement and analysis capabilities, including a powerful scripting language. In addition, the unit has been designed for scalability and high reliability. It is capable of being connected to a variety of other machine components and supports switching between different systems and tasks. Redundant power sources can be provided to ensure uninterrupted operations. EG 2001 X is a robust, high-performance prober tool capable of quickly and accurately probing wafers and devices. Its modular design, wide range of probe styles, and advanced vision asset make it suitable for a wide range of production environments. It is capable of providing excellent scalability and reliability, making it ideal for chip characterization and production testing applications.