Used ELECTROGLAS / EG 2001X #9194747 for sale

Manufacturer
ELECTROGLAS / EG
Model
2001X
ID: 9194747
Wafer Size: 6"
Manual wafer probers, 6".
ELECTROGLAS / EG 2001X Prober is a commercial wafer-probing station manufactured by EG and is designed for the testing of semiconductor wafers. It is ideal for use in production line and lab environments, as it is able to perform high-precision scanning and testing tasks quickly and accurately. EG 2001 X Prober has several key features that make it an ideal choice for semiconductor testing. It comes equipped with an advanced 3-axis equipment, which allows for precision pattern recognition and automated control. This system is combined with 200 pin capacitance-coupled probing nodes, allowing for testing of multiple pins simultaneously with high accuracy. The platform also includes an automated 3-axis sample loader, which offers fast and precise alignment with samples, and a high resolution microscope that provides close-up views of the wafers being tested. ELECTROGLAS EG2001X Prober is capable of testing a wide range of semiconductor materials, including aluminum, silicon, gallium arsenide, and others. It can handle a maximum wafer size of 12" and has a maximum number of pins of 120 per test site. The unit is also capable of performing multiple tests in parallel, to reduce turnaround time. It also has the capability to store test patterns, and has a built-in timing generator and logbook that can be used to store testing information. This commercial wafer-probing station is equipped with an intuitive and easy-to-use graphical user interface (GUI), which allows for quick programming and setup. It is also capable of providing real-time access to the testing information, which is shown graphically and numerically. This allows for fast troubleshooting and efficient product testing. Overall, 2001 X Prober is an excellent choice for accurate and precision testing of semiconductor wafers. Its 3-axis machine provides superior pattern recognition and automated control, while its 200 pin capacitance-coupled probing nodes make parallel testing quick and easy. The built-in functionality also makes it easy to store test patterns and access test information, and its intuitive GUI makes setup and programming a breeze.
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