Used ELECTROGLAS / EG 2001X #9224663 for sale

ELECTROGLAS / EG 2001X is an advanced semiconductor prober that can be used to test a wide variety of semiconductor devices. It is a highly versatile prober with numerous specialized features including positioning accuracy and repeatability, high-speed programmable motion, and software-driven pattern-matching. With its advanced technology, EG 2001 X is suitable for a variety of probing applications including electrical testing, failure analysis, and yield enhancement. ELECTROGLAS EG2001X has a-digitally electronically deskewed dual-head design with a four-quadrant X/Y configuration that increases the accuracy and repeatability of measurements. Each head is equipped with a UHV compatible tip metrology equipment that is capable of accurately measuring the tip radius and orientation of each probe. This ensures that the probes deliver precise results during probing. EG EG2001X's programmable motion control system provides high speed and accuracy of probing. The prober's motion control unit can be programmed for simple and complex motion patterns, allowing for a variety of testing procedures and multiple measurement points. Additionally, EG 2001X's advanced positioning machine can be programmed with positional parameters based on the application and wafer size. ELECTROGLAS 2001 X's LAN-controlled software-driven pattern matching capability allows for accurately positioning and measuring multiple tests with minimal operator intervention. This advanced feature makes 2001X an ideal tool for both test and failure analysis applications. 2001 X's UHV compatible design enables probes to be used without damaging a wafer or disturb an existing micro-fabrication process. This makes EG2001X suitable for many production applications including yield improvement, as the UHV tool ensures gentle and repeatable probing without damage. ELECTROGLAS / EG EG2001X is a highly versatile prober suitable for a variety of probing applications, including electrical testing, failure-analysis, and yield enhancement. With its advanced technological capabilities such as programmable motion, electronically deskewed dual-head design, UHV compatible probe tip metrology, and software-driven pattern matching, ELECTROGLAS / EG 2001 X delivers highly accurate and repeatable results.