Used ELECTROGLAS / EG 2001X #9254223 for sale

Manufacturer
ELECTROGLAS / EG
Model
2001X
ID: 9254223
Prober With AI wafer mapping capability.
ELECTROGLAS / EG 2001X is a prober used in the testing of electronic components and printed circuit boards. It is designed to be used in a variety of electronic assembly, testing and measuring tasks. EG 2001 X allows for the accurate and repeatable characterization of small electrical components in a variety of configurations and test environments. It is used in many different fields such as device testing, surface analysis, current/voltage de-embedding, and RF testing. ELECTROGLAS EG2001X can also be used for characterization of devices with unknown pulse response, dynamic impedance measurement, and compliance testing. EG2001X has an automatic pattern generator for user-defined test scripts and waveforms. The high speed, 10 MHz - 1 GHz bandwidth system also features precision, repeatable, and fine positioning of the probe. The high speed of 2001X is also enhanced with the addition of the 12-bit A/D converter that allows for sampling rates of up to 10 Mega Hertz, as well as a choice of 16, 8, and 4 bit voltages. The prober also has a new probe memory, which is able to store configurations for 10X faster programming and settling time. ELECTROGLAS / EG EG2001X allows for different probe tip configurations with a unique design that enables users to change probe tips without the need for additional tools. The prober is designed to be durable and reliable in order to meet the needs of intense manufacturing and process control environments. The prober also comes with a display that shows sharp and clear test results. It has an easy to use graphical user interface which allows users to quickly access and deploy an array of programs and instructions. The2001X is a customizable prober, with accessories for greater system flexibility such as additional probes, contact checkers, motorized XY stages, and optical interferometers. The system is designed to be easily integrated with other open architectures, making it easy for the other processes to be interfaced, monitored, and automated. In summary, EG 2001X is a high speed prober that is designed for precision testing and measurements of electronic components, devices, and printed boards. It provides high repeatability and accuracy with a wide selection of probe tips and user-friendly interface. It is highly durable and can be integrated into other open architectures for greater flexibility.
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