Used ELECTROGLAS / EG 2001X #9282035 for sale

ELECTROGLAS / EG 2001X
Manufacturer
ELECTROGLAS / EG
Model
2001X
ID: 9282035
Wafer Size: 12"
Prober, 12".
ELECTROGLAS / EG 2001X is a general-purpose, high performance, prober equipment designed for testing integrated circuits, discrete devices, and hybrids. It is the newest addition to EG family of probers, offering improved performance with a smaller form-factor and faster testing speeds. EG 2001 X is a fully automated system that can run at high throughputs and offers excellent accuracy and repeatability in testing. ELECTROGLAS EG2001X is configured with a built-in digital probing unit and an ergonomic cabinet design. The machine's on-board electronics enable it to achieve a higher contact force accuracy for better test results, with probing speeds of up to 350 kHz. The machine's modular design permits flexibility in test fixture configurations, with both benchtop and rack-mountable configurations available. It features interchangeable probes for quick configuration changes and can accommodate a range of different probe cards. In addition to benefiting from a higher accuracy level, the tool has a high throughput, with its two test probe heads capable of probing over 1000 individual pins in one pass. 2001X also features a user-friendly touchscreen interface, enabling users to quickly learn and understand the asset's functionality. This makes the model easy to operate and learn, saving valuable time and allowing users to devote more energy to testing and analyzing results. For further efficiency, the equipment incorporates two quasi-static accelerometers for measuring acceleration, shock, and vibration during testing. This adds an additional level of data collection and analysis, ensuring that test results are more accurate. ELECTROGLAS / EG EG2001X also features an integrated wafer handling system, allowing for higher levels of automation and improved wafer handling speed. Overall, ELECTROGLAS 2001 X offers a reliable, cost-effective, and established solution for testing semiconductor devices. With its improved accuracy, faster probing speeds, and expanded test options, this unit provides a reliable testing environment that is ideal for use in labs, production lines, and quality assurance environments.
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