Used ELECTROGLAS / EG 2001X #9316386 for sale

ELECTROGLAS / EG 2001X prober is an advanced platform designed to enable semiconductor companies to quickly and reliably test, inspect, and characterize wafers. It is capable of high accuracy in tests of up to 20,000 probing sites per wafer, and is well-suited for die-level and wafer-level tests. EG 2001 X is equipped with an X-Y Stage and 4-axis motion control system that can handle wafer sizes up to 8". The X-Y stage has a high positioning accuracy of ±2 μm, and the 4-axis motion control system features an advanced PID loop control for ultra-smooth speed and acceleration control. The built-in diagnostic system allows users to quickly diagnose and troubleshoot any problems that may occur. The prober also offers a wide range of options to suit any application. These include an edge-passable substrate cassetter, quad telescopic probe card arms, probe card edge holder, probe card air cooling, and a test head cooler. As well, it's possible to connect up to four negative pressure systems to increase the number of test points. ELECTROGLAS EG2001X also features a number of user friendly features such as the user-friendly graphical user interface, automated wafer alignment, and fast test times due to its advanced DMAISC test sequence. The prober is compatible with a variety of test programs, allowing the user to easily customize their tests and find the best solution to their specific needs. As a whole, EG EG2001X is an advanced high-performance prober that was designed to increase production capacity and yield. It offers fast testing times, highest accuracy and flexibility for all types of wafer testing. Its user friendly features make it easy to use and the wide range of options makes it suitable for all types of users. In short, this prober provides the perfect solution for customers looking for reliable wafer testing.