Used ELECTROGLAS / EG 2001X #9351735 for sale

ELECTROGLAS / EG 2001X Prober is an industry-leading technology specifically designed to rapidly analyze millimeter-level characteristics of semiconductor wafer chips. This advanced prober possesses a subsystem with varied electrical, thermal and mechanical components to detect minute flaws in the manufacturing process, as well as to conduct accurate and repeatable measurements of current, voltage and other related parameters. More specifically, EG 2001 X Prober includes a proprietary wafer measurement controller, which is designed to quickly and accurately measure parameters while providing unparalleled precision and accuracy. It makes use of precision GP-IB and computer-controlled motors to accurately position probes against the wafer and measure the electrical characteristics of the device under test. This allows it to ensure exact and reliable measurements and highly reliable diagnostics from wafer to wafer. The prober also comes fitted with a highly sophisticated vision system to facilitate precise alignment and to detect mis-alignments in selected pixels with accuracy. These systems are also designed to accommodate a wide range of wafer designs and complexities, with automated flexure and quick pathing mechanisms that ensure efficient wafer loading and unloading. The prober also offers a 'Smart' software technology feature, which operates in real-time, ensuring measurements and diagnostics can be quickly performed to locate any possible flaws. Furthermore, the prober can be fitted with specific modules to satisfy any wafer-level test requirements. ELECTROGLAS EG2001X is also capable of providing a vast range of application programs, which enables the user to select the correct measurements, parameters and sequences automated for their specific applications. It also possesses enhanced control capabilities for greater flexibility and accommodates all in-house software configurations. Moreover, the prober also possesses a comprehensive library generator for the development of new and specialized test applications, allowing for the creation of unique test suites, as well as the ability to incorporate emerging technologies. Overall, ELECTROGLAS / EG 2001 X is an advanced and reliable prober, offering an efficient system to accurately measure and detect device flaws. With its precise, repeatable and fast measurements it offers the user a comprehensive solution in wafer chip analysis and ultimately product quality inspection.