Used ELECTROGLAS / EG 2001X #9356489 for sale

ELECTROGLAS / EG 2001X is a semiconductor wafer prober designed to test the performance of integrated circuits. The prober is capable of automated, high-speed probing of wafer surfaces. EG 2001 X operates on a vector-based equipment, which can scan up to 150 probes in parallel. This allows the prober to handle large numbers of test points with extremely low latency. At a rate of up to 5 million test points per second, the prober offers precision and speed for high-volume production. The prober is powered by an integrated system of motor controllers that provide fine control over position and speed. This allows the prober to provide accurate and repeatable results. In addition, ELECTROGLAS EG2001X has double-axis servo motors to ensure that test vectors are maintained within tight tolerances. The prober also utilizes an automated calibration unit. This machine can track, measure, and digitally record calibration results. Additionally, 2001X provides in-depth analysis of test data and wafer surface morphology. This feature allows users to compare measurement data from different test environments and derive deeper insights into circuit performance. ELECTROGLAS 2001X is designed to operate effectively in a wide range of environmental conditions. This includes temperature environments ranging from - 15° - 55° Celsius, and humidity from 20% to 80%. In addition, the prober has ESD, over-voltage, and over-current protection mechanisms, allowing it to perform reliably even in demanding test environments. EG EG2001X also comes with a suite of software for controlling the probe and analyzing test data. The tool is compatible with a variety of third party software applications, making it highly versatile. All in all, the prober offers powerful performance, reliability, and versatility for semiconductor wafer testing.