Used ELECTROGLAS / EG 2001X #9366636 for sale
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ID: 9366636
Wafer prober systems
Gold chuck, 6"
Belt track handler, 6"
RC2 Ring carrier
Monitor console
Operator console
Wheels and feet
Probe card holder.
ELECTROGLAS / EG 2001X Prober is a versatile automated test equipment designed for testing and analyzing a wide range of semiconductor devices and circuits. It utilizes a powerful 200 MHz CPU along with an advanced software reprogrammable technology, enabling the prober to execute complex tests and data collection in real-time. The system features high-speed process ranging from 5ms to 500ms, and a variety of probing programs can be combined to achieve the desired results. The integrated Visual Planner program creates detailed layouts for each device tested, taking into account the device's physical characteristics such as its size, shape and pin configuration. EG 2001 X Prober offers high-performance features such as a high-resolution test rate of up to 20k Hz, simultaneous 6-channel measurement, multi-site parallel testing capability, and 4- and 5-axis auto-positioner drivers. The unit also has an open architecture with a patented multi-level Programmer Interface, providing enhanced flexibility for developing and managing tests. Additionally, it supports a wide array of probing tips, allowing users to precisely measure every contour. The prober also utilizes a high-speed linear motion stage to precisely move the probe tips over the component's surface, ensuring accurate measurements. ELECTROGLAS EG2001X Prober offers superior signal integrity, enabling users to perform tests in the presence of machine noise. The measurement electronics feature high-bandwidth and low-noise circuits, allowing for accurate measurements with minimal signal distortion. It also offers a variety of control/measurement options including standard, differential, and current sensing modes, as well as multiple scan modes to facilitate high-speed testing of both linear and non-linear devices. EG2001X Prober meets industry-wide safety standards and its compact design provides superior stability for testing. It also enables users to monitor and record test data, with data logging available through standard USB or Ethernet connections. Furthermore, this powerful prober is also compatible with various Windows operating systems, allowing for easy training and use. The EN ELECTROGLAS / EG EG2001X Prober is an efficient and reliable test tool for testing and analyzing a variety of semiconductor devices.
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