Used ELECTROGLAS / EG 2001X #9375773 for sale

ELECTROGLAS / EG 2001X, also known as EG 2001 X, is a prober or wafer probing unit used to screen and qualify integrated circuits. It is manufactured by EG and is part of the family of wafer probing systems they offer. Through a combination of powerful hardware components and advanced software, ELECTROGLAS EG2001X provides a precise, reliable solution to the complex tasks of measuring and testing ICs and other components in the manufacturing process. 2001X has an 8 in. low profile chuck that supports probe cards of various sizes and styles. It is also equipped with multiple independent XY planar motion control systems with a resolution of 40nm. The high-resolution video alignment equipment offers automated sight alignment confirmation and ELECTROGLAS 200X utilizes a wide range of optional probing heads, including full probing, half probing, contactless probing, and laser probing. EG EG2001X's sophisticated software handles a wide range of tasks, from setup and data parameter entry to data analysis and corrective modification. Its user-friendly GUI enables easy navigation and control of the many features of the prober. The powerful scripting language allows all kinds of scripting operations to be performed, and users can customize the system to match their application needs. For added accuracy and reliability, ELECTROGLAS / EG EG2001X includes a vacuum container with a 99.9999% filtration rate. It utilizes patented process schematics and a fully synchronized unit of sensors that monitor all of the processes and components in the prober chamber. These precisely monitor voltage, current, temperature, etc. to ensure the accuracy of the results. The I/O module for EG 2001X contains advanced components, making sure that data acquisition and data transmission is accurate, dependable, and secure. This I/O module is mounted directly on the main board where it operates under the protection of an ESD guard. ELECTROGLAS / EG 2001 X is equipped with an ACS motion module for unparalleled motion accuracy and control throughout the manufacturing process. Additionally, a built-in diagnostics machine on the prober can analyze and display results on the main display screen. This allows a greater level of control and troubleshooting from the user for improved accuracy and fewer mistakes.