Used ELECTROGLAS / EG 2001X #9375774 for sale

ELECTROGLAS / EG 2001X is a high performance prober that is used in semiconductor device testing and burn-in operation. It is integrated with the sophisticated Defect Map Analysis Equipment (DMAS) that enables the quick access of the defect location in a substrate surface and allows higher analysis rate during production. The prober is configured with a flexible space-saving design which includes an automated transport mechanism for moving the substrates between the test system and prober station. It also includes a dual layer unit that permits two level probing and part out testing during a single test cycle. The prober has a motion stage with X, Y, and Z drives which allows for accurate positioning of the substrate toward the (Z) test surface. EG 2001 X is powered by an advanced servo positioning control machine that ensures repeatable and precise motion of the substrates. This is accomplished with the use of encoders, capacitive bearings, optical limit switch sensors, and a high precision laser interferometer. The prober also includes an integrated CAD tool that provides visual programming of test recipes for maximizing throughput and decreasing test time. The Probe Head used with ELECTROGLAS EG2001X is capable of accommodating a broad range of high frequency test requirements. It can be set up with various probe styles, such as coaxial, triaxial, and tweezers. The Head is also equipped with an advanced micro-positioner that permits fine adjustments while probing. Another benefit of the asset is the capability of controlling up to 256 individual parameters with a self-diagnostic measurement protocol. EG2001X prober comes with a wide array of accessories for enhancing testing and probing operations. These include SMIF pod for parts delivery, loose parts pins for through hole connections, and various types of adapters for accommodating different types of substrates. The prober also supports a variety of test and burn-in products such as Auto Probe, Auto Test, and Auto Burn-in. Overall, ELECTROGLAS / EG 2001 X is a robust prober with a wide range of features designed to ensure accurate and reliable test results. It is an essential tool in the semiconductor device testing and burn-in operations.