Used ELECTROGLAS / EG 2001X #9383376 for sale

ELECTROGLAS / EG 2001X is a high performance wafer prober specifically designed for use in optoelectronic and semiconductor testing. It is capable of testing chipsets and packages with sizes ranging from 0.3mm up to 1.6mm. The prober comprises of a mechanical table and two independent scan axes, a fast scan (driven by a 0.5mm pin) and a slow scan (controlled by an optical surface scanner). This enables the prober to produce images for wide range measurements and high density sampling. EG 2001 X prober is equipped with a highly sensitive capacitance detecting system. This allows for up to 400,000 surface points to be scanned, providing improved accuracy and resolution as well as repeatability. The electrostatic chucking system enables even the smallest die to be held securely, ensuring accurate measurements. The prober is capable of measuring resistance and capacitance, with precision of plus or minus 10%. ELECTROGLAS EG2001X prober can be operated either manually or using software. For manual operation, the prober can be operated by using a foot pedal or by simply pressing a button. For software automation, the prober is compatible with Pro Scope, Pro Multi Gage, and Pro Xact SPC software. The software can also be used for monitoring and looking up results. 2001X has an intuitive user interface which makes it easy to operate. The prober also features a heated plate, allowing for increased heat transfer efficiency and improved mesa topography detection. The prober comes with an integrated camera so that visual inspection can be performed. It also offers a range of measurement capabilities, including high impedance measurements, R-C measurements, and air gap measurements. Overall, ELECTROGLAS / EG EG2001X is an advanced wafer prober, offering excellent performance and accuracy, as well as a comprehensive feature set. It is a versatile and reliable tool for optoelectronic and semiconductor testing, and is widely used in the industry for its efficiency and ease of use.