Used ELECTROGLAS / EG 2001X #9398570 for sale

ELECTROGLAS / EG 2001X is a multi-functional prober designed for use in semiconductor test and analysis applications. This prober offers a wide range of capabilities, including the capability to perform electrical testing and probing of integrated circuits, including those with fine-pitch leads, as well as physical probing, including X-ray tomography. EG 2001 X prober has a customizable high-speed multi-axis stage which can be used to quickly and accurately position the specimen. It utilizes a programmable graphical user interface that allows the user to set exactly the positions desired. The prober has a unique capacitive moving head that provides excellent electrical contact to assure reliable probing results. It uses a piezo-electrically driven wafer leveler to level the specimen before probing. The wafer leveler also provides enhanced contact between the testing site and the probe tips. The prober is designed to accommodate up to eight test cards, which can be conveniently loaded into the machine for testing. The equipment is equipped with a high-resolution CCD camera and image processing capability, which allows for the manipulation of captured images to make them suitable for analysis. It also has an optical microscope that provides detailed images of the probes and the test site, allowing for more accurate probing. It is also equipped with a high-speed scanning electron microscope that is capable of producing subpixel-level images of test sites for the purpose of failure analysis. ELECTROGLAS EG2001X prober system is typically used in conjunction with specialized wafer probers, such as the Agilent 9500 series or the GSI-MicroTec MMC-9000. It is also used with test handlers and other peripheral equipment, such as chillers, temperature/pressure controllers, and data acquisition/analysis systems. In addition, the unit is capable of powering up and testing integrated circuits or subassemblies. ELECTROGLAS / EG 2001 X prober is a versatile tool that is well-suited for semiconductor device testing and analysis requirements. It is capable of providing reliable probing and testing results due to the combination of its advanced hardware and user-friendly graphical user interface. Furthermore, the machine is designed for quick set-up and testing, as well as easy maintenance and upgradability. The tool provides a powerful as well as cost-effective solution for any semiconductor device testing and analysis application.