Used ELECTROGLAS / EG 2001X #9402447 for sale

ELECTROGLAS / EG 2001X is a state-of-the-art high performance prober designed for semiconductor testing and probing applications. It has a wide variety of features that make it an ideal choice for a multitude of applications. EG 2001 X is configured with a 4-axis motorized head, which allows for precise positioning of test fixtures and substrates. Furthermore, the X-Y stroke of 50mm in each direction provides the capability to access a wide range of devices and substrates. The prober also features the world's first over-cupping technology, which allows for greater flexibility in analyzing different types of probes. This enables the device to solve challenging shots and align difficult substrates. Additionally, the integrated wafer scanning system is capable of detecting complex shapes and sizes up to 3 inch in size. The integrated laser sensing system provides a reliable way for determining the exact location of the probe tip during probing and testing. To ensure high levels of accuracy and performance, ELECTROGLAS EG2001X is equipped with a native resolution of 1 micron. Moreover, the integrated automatic calibration feature requires minimal operator intervention and reduces potential operator errors. Furthermore, the prober utilizes a next generation thermal compensation to limit the effects of substrate heat and humidity on the probe results. 2001 X is also loaded with features that increase its efficiency and usability. The device is equipped with a 16 megapixel color camera, which allows for detailed analysis of the probe results. The prober also features advanced data logging technologies, which enable the user to store and analyze test results. And its advanced probe management system allows operators to access and configure the test parameters remotely, eliminating the need for manual setup. Overall, ELECTROGLAS / EG 2001 X is one of the most advanced probers currently available. Its robust configuration and cutting-edge features make it an ideal choice for challenging semiconductor probing and testing projects.