Used ELECTROGLAS / EG 3001X #293604678 for sale

ELECTROGLAS / EG 3001X is a prober used to test the electrical characteristics of integrated circuits and other semiconductor devices. It is capable of probing various types of circuits and can produce high-resolution data, allowing for a thorough assessment of the electronic properties of the devices being tested. EG 3001X consists of three main components: the probe station, the probe head, and the control electronics. The probe station is used to align and position the probes and provide a stable environment while the test is being performed. It also includes a probe retraction mechanism to protect delicate circuits from damage during the test. The probe head contains the components of the prober that actually contact the device being tested. It may include multiple probes of varying sizes and shapes, allowing for the testing of different types of chips. It may also include mechanical arms used to protect the probes from movement during the test. The control electronics consist of interconnected computers for measuring, recording, and storing data from the probes. ELECTROGLAS 3001 X has a wide range of features, including an accuracy of 0.2 micron, a programmable logic function, a high-speed logic analyzer, and a GRAIL network adapter. This prober also has support for various test packages, including SSA, WSA, and CSA. 3001X is designed to be used in laboratories, universities, and other research organizations. It is an efficient and reliable device for testing and analyzing the electrical properties of integrated circuits and other semiconductor devices.