Used ELECTROGLAS / EG 4060 #9402441 for sale

ELECTROGLAS / EG 4060 is a semiconductor prober designed to perform precise, high-quality probing and testing processes for advanced semiconductor devices. It is a modular prober that can be configured to meet a variety of test requirements including front side die probing, wafer mapping, flip chip probing, and array probing. It can accommodate wafer sizes up to 200mm. The base equipment features a moving XY table, a prober head, and a high-resolution XY motion controller. It has a closed-loop motion system for precise motion control of the XY table, allowing for precise placement of probe cards, wafers, and other components. It has a built-in air curtain unit for preventing electrostatic discharge (ESD). An air heating machine maintains a temperature of up to 450°C in the active area. EG 4060 prober also has powerful process-mapping software that controls the entire probing process. This software offers a large selection of test parameters and automated test procedures. It has the ability to store up to 1000 parameters that can be quickly configured during the probe process. It offers the ability to create high-speed scanning of wafers and parts, high-speed contact closing, and high-speed coordinate inquiry. The tool is compliant with ANSI/IEC 61010-2/3/4. It meets ISO 17025 requirements for calibration and meets NEBS certified design requirements. It also features an advanced capacitive sensing asset for improved probe contact accuracy. In addition to its core capabilities, ELECTROGLAS 4060 platform supports a variety of peripheral devices and software options that can be used to customize the model for specific applications. Options include programmable liquid dispensers, optical microscopes, digital image capture cameras, and laser scanning systems. Overall, 4060 is a powerful, reliable prober that can be configured to meet any test requirement. It is designed for precise probing and testing of a wide variety of semiconductor devices, offering users an optimal solution for their test and measurement needs.