Used ELECTROGLAS / EG 4060 #9402442 for sale

ELECTROGLAS / EG 4060 is a prober designed specifically for precise probing of small-scale microelectronics devices. This prober has been used for high-precision probing of highly integrated circuits and other small-scale chip devices. It is capable of testing 4-inch sized wafers and up to 12,500 probes across the 10×10 mm pitch, allowing precise placement of metal and dielectric test points to verify performance of each device. The built-in automatic test program of EG 4060 prober can be used to sequence multiple tests with minimal user intervention. It offers programmable test stand and wafer positions, as well as multiple motion control functions. This enables the prober to accurately and repeatably measure the probe position relative to each test point without the need of manual adjustments. Using the advanced algorithms of ELECTROGLAS 4060, testing exactly where a connection needs to be made can be made quickly, accurately, and repeatably. This reduces errors due to user manipulation, reduces setup time and optimizes the date rate. In addition, the prober features multi-site probing capabilities that allow for the simultaneous testing of multiple sites on one wafer. All these features enable users to produce test data quickly and efficiently. The prober also offers high-resolution and high-accuracy data. It uses an advanced CCD camera to accurately measure the position and shape of the probes, allowing for accurate contact area determination. This provides precise measurements that reduce false read output. 4060 is a reliable and efficient prober that has loads of features designed to ensure efficient and accurate probing of small-scale microelectronics devices. It offers high-accuracy and repeatable data, a fast test stand and wafer positions, and simultaneous testing of multiple sites on one wafer. This provides users with precise test data and reliable performance across a wide range of designs.