Used ELECTROGLAS / EG 4060 #9402444 for sale

ELECTROGLAS / EG 4060 is a prober designed to provide dynamic and static probing of a wide range of materials and components. It is capable of testing and debugging at the Pin, Die, Chip and Wafer level for a variety of applications. The prober operates on an automatic equipment, controlling all the steps related to the testing and debugging procedure automatically. It has an operating range from 0.1 to 300mm with a maximum probing height of 50mm. The prober comes with a motorized stage, which has a large working area of 300mm x 200mm, enabling the placement of components with varying widths and lengths. EG 4060 utilizes a multi-sensor probe head, providing optimum strain relief and accuracy when scanning large or small components. The prober also features a vibration isolation system for smoother operation during testing, adjustable stage positioning for testing of multiple components and an intuitive user interface for ease of operation. Furthermore, the prober has a proprietary circuit hardness tester, enabling the testing of pins, die, packages and wafers. ELECTROGLAS 4060 has an accelerated scanning speed, with an increase of up to 20+ wafers per hour. In addition, the prober takes into consideration the tight outline spaces for testing, making it ideal for manual probing with a combination of automatic and manual alignment techniques. It features an integrated vision unit for quick and accurate probing, as well as flexible programmable vision parameters to accommodate various components and applications. Also, the prober offers a choice of three failure evaluation modes, allowing users to select the best one for their application; scanning on voltage and error analysis to identify floating pins, short circuits and conductor breaks, wrapping of pins and pads or general visual inspection. This makes it an ideal tool for production, engineering and laboratory testing of components and materials. Finally, the prober has an efficient temperature control machine, which enables batch testing of high temperature components up to 150°C, while maintaining a steady temperature across multiple components.