Used ELECTROGLAS / EG 4080 #293602340 for sale

ELECTROGLAS / EG 4080 is a full-featured prober designed for the semiconductor assembly industry. It is designed to provide accurate testing of components and assemblies at fine line pitch, up to and including 0.005" (0.12 mm), allowing for detailed analysis of device characteristics. The prober is a direct drive equipment with no moving parts, providing reliable, repeatable, and accurate testing capabilities. EG 4080 utilizes a patented orthogonal drive system, allowing fast, precise movement of probes over the device under test. ELECTROGLAS EG4080 has a number of features to ensure accuracy and reliability in the testing process. These include low-noise test signal conditioning circuitry, signal-to-noise shielding, and digital signal processing and signal recognition technology. In addition, the prober has a multi-stage pre-regulator/delay circuit to maintain accuracy of tests at fine line pitch. A predictive model algorithm is provided to determine contact location, even on odd-numbered sites, while specialized tip geometries ensure accuracy of data readings. The prober is also equipped with a variety of probe cards, allowing easy testing of a variety of component packages, such as flip chips, CSPs, SOIC, SIPs, DIPs, and many more. 4080 prober also offers a wide range of built-in test programs, allowing flexibility to accommodate the specific needs of each user's application. The probers' intuitive, easy-to-use software helps reduce the learning curve associated with using the prober, while a number of diagnostic features help to ensure accuracy and repeatability in testing. The unit also includes a fully-featured wafer handling machine, which is designed to minimize strain on sensitive devices and ensure accurate handling of delicate parts. Additionally, the tool supports a wide range of industry-standard media, allowing for convenient data transfer and analysis. ELECTROGLAS / EG EG4080 is a reliable and efficient prober, and with its wide range of features and capabilities, it is sure to meet the needs of any semiconductor assembly house. Its superior performance and accuracy make it an ideal choice for testing devices at the fine line pitch, allowing for precise analysis and intricate device characterization.