Used ELECTROGLAS / EG 4080 #293644436 for sale

ELECTROGLAS / EG 4080
Manufacturer
ELECTROGLAS / EG
Model
4080
ID: 293644436
Prober.
ELECTROGLAS / EG 4080 is a wafer prober designed for high-speed testing and probing of wafers and other substrates in semiconductor and electronics applications. This versatile prober is capable of providing rigid and accurate repeatability for production testing. The prober features a large testing area, enabling high throughput and flexibility when probing interior and exterior parts of device packages or probing opposite sides of the same package. The handling equipment is designed with an efficient quick-release system, allowing the operator to quickly change out wartsacks or accessories without recalibration. The optional chuck unit provides up to ten times the force of standard chucks to ensure secure wafer clamping. EG 4080 comes equipped with a range of standard test functions, including parametric testing, series testing, circuit testing, contact array testing and photolithography testing. The prober has a highly advanced data acquisition machine, which can accurately measure and report on virtually every test parameter required. This data acquisition tool is able to continually monitor the operation of all relevant subsystems and provide feedback instantly, allowing for precisely repeatable test readings. The prober consists of an integrated casing, an X Y motor drive, a Z motor drive and a versatile prober cable asset. It comes with an LCD display for easy operator control. It also has a comprehensive range of motor outputs, inputs and communications. At the heart of the model is a user selectable microprocessor, which allows for powerful and seamless execution of multiple test routines and operations. ELECTROGLAS EG4080 is an innovative precision engineered wafer prober. Its combination of robustness and accuracy provides reliable results under high-volume testing conditions. It has a broad range of test functions and wide array of additional control devices, allowing it to tackle the challenges of devicelevel test applications. This prober is ideal for the mass production environment, quickly and efficiently analyzing performance and providing effective quality control.
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