Used ELECTROGLAS / EG 4080 #9375666 for sale

ELECTROGLAS / EG 4080 is a prober designed for a full range of semiconductor device testing applications. It is an advanced, highly configurable in-circuit prober that offers a wide variety of features and capabilities to meet the needs of a wide range of semiconductor device testing requirements. EG 4080 features a wide range of adjustable probing systems, including vertical probes, horizontal probes, compression spring probes, and DUT probes, allowing for various types and sizes of semiconductor devices to be tested on ELECTROGLAS EG4080. The system also includes a variety of scanning options, allowing users to scan across the top of the device in a selected area, and to adjust the parameters of the scan to suit the specific needs of each device. Additionally, EG EG4080 supports multiple probing systems, enabling users to control multiple probes for multiple devices, all within the same system. EG4080 also features advanced testing applications such as temperature cycling and thermal flow testing, which can be used to test the durability of semiconductor devices under varying temperatures and flow conditions. It also offers fast and automated fault analysis tools that enable users to quickly troubleshoot issues and then take appropriate corrective action. 4080 offers powerful diagnostic and programmability features, including an advanced programming language called FTAS, which allows users to define complex test plans and create powerful test services using the FTAS language. With advanced features such as Networked Probing, users can easily control and monitor multiple probers from a single PC, resulting in improved testing throughput and greater test flexibility. ELECTROGLAS 4080 also offers advanced data logging capabilities, helping users to analyze and record data collected during testing for future reference and analysis. The prober also supports device diagnostics and debugging, allowing users to identify and debug problems quickly and efficiently. ELECTROGLAS / EG EG4080 has a wide range of applications in testing various types of semiconductor devices, and is flexible enough to be used in a range of testing environments. The advanced features of the prober make it a suitable choice for a wide range of advanced testing needs. Its powerful diagnostic and programmability features, along with its efficient and automated fault analysis capabilities, make it an ideal choice for testing and debugging various semiconductor devices.