Used ELECTROGLAS / EG 4080X #293625478 for sale

ELECTROGLAS / EG 4080X is a high performance prober designed for advanced wafer probing applications. It features a robust mechanical design and a fully integrated suite of software and hardware components. The prober is suitable for both manual and automated operation and can handle wafers of up to 8 inch diameter. The prober offers an omni-directional prober arm with the patented EGC control mechanism which enables high-accuracy, low-noise and repeatable probing. The prober also features an adjustable probe card adapter, allowing users to easily switch between any probe card without the need for recalibration. EG 4080 X is equipped with motors and a servo loop control equipment to ensure precise and repeatable movement of the prober head. The prober is engineered with an onboard operating system for quick and easy setup and operation. The intuitive user interface provides real-time display and logging of scan data, as well as a library of prober specific settings. Users have full control over probing parameters such as speed, acceleration, and contact force in both the X-Y and EGC axes of the prober. ELECTROGLAS EG4080X prober is also well-suited for advanced applications such as bumped die probing and flip chip measurements. Its programmable probe card arrangement enables users to easily select the optimum needle and probe unit for any prober application. The prober is based upon EG set of instruments, with in-built features for leak testing, serial programming, process control, and data collection. To increase productivity, the prober supports multi-die probing, allowing users to quickly and accurately probe multiple dies in a single test. The prober is designed for robust performance and maximum reliability in the most challenging environmental conditions. Its IPMI card ensures that any out-of-tolerance operating parameters are quickly recorded, identified, and rectified in-field. This feature also provides the ability for remote control of the prober. In conclusion, ELECTROGLAS 4080X high-performance prober is an advanced wafer probing tool capable of both manual and automated operation. It is equipped with a unique omni-directional prober arm, an integrated operating machine, and an adjustable probe card adapter, enabling users to rapidly probe a variety of wafers and devices. This highly reliable prober is ideal for the most demanding probing applications and is the perfect solution for both general and advanced wafer probing needs.