Used ELECTROGLAS / EG 4080X #293648646 for sale

Manufacturer
ELECTROGLAS / EG
Model
4080X
ID: 293648646
Prober.
ELECTROGLAS / EG 4080X is a prober designed for use in wafer probing applications. It is an advanced prober designed to meet the demand for high accuracy and speed, while also providing the user with a range of advanced features and automation options. EG 4080 X utilizes a single-arm, vertical linear motor for moving the wafer, providing smooth and precise positioning of the sample. The prober has a wide range of motion, with a maximum of 8mm of range in the X-axis, 6mm of range in the Y-axis and 28mm of range in the Z-axis. Built with advanced sensors, ELECTROGLAS EG4080X is capable of high accuracy sample placement, with an accuracy of ±15µm. The prober has a maximum sample size of 4-inch and can be used with a variety of sample types, including flat chips and split wafers. EG4080X is capable of working with a variety of programs, offering users efficient and capable programming. It is equipped with an easy-to-use control environment, allowing the user to flexibly program the platform for their interpreting tasks. Designed with a number of advanced automation features, ELECTROGLAS 4080X can handle many different wafer probing operations with ease. It is capable of performing a range of pre-alignment operations, such as auto-leveling, pre-aligning and mapping. The prober also has a wide range of options for applications such as elecs, manual pick and place, needle probing and contact probing. 4080X has a high throughput, capable of handling as many as 4,000 contact points per hour. ELECTROGLAS / EG 4080 X is equipped with a range of additional features, such as the Auto-Stereo-Graphic Feature, which allows for probing multiple contacts at a time while ensuring the contacts are in the same plane. The prober is designed to be easy to use, with a touchscreen control interface, intuitive design, and easy-to-follow instructions. ELECTROGLAS 4080 X is a reliable platform, with a robust design and cutting-edge features, ensuring reliability in wafer probing applications.
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