Used ELECTROGLAS / EG 4090 #293589309 for sale

ELECTROGLAS / EG 4090 is a prober equipment used to electrically test small components such as semiconductor die, integrated circuits, and printed circuit boards. It is versatile, easy to use, and features a reliable design, making it an ideal choice for testing and troubleshooting a variety of components. At its core, EG 4090 is a computer-controlled prober with an easy-to-use, modular design. It contains an integrated power supply, probe head, stage adapter, and test head, allowing the user to quickly build customized test solutions. The versatile prober can be configured to support a variety of different board formats, such as standard rectangles, discs, pins, and more. ELECTROGLAS EG4090 features a number of features and capabilities that make it an effective tool for electrical testing. For example, it utilizes an in-line vector modulation system that allows for precise signal analysis, spectral analysis and acoustic measurement. The unit also features an intuitive user interface, enabling a wide range of programming capabilities and reducing set-up time. The machine's full-color touchscreen and integrated diagnostics provide the user with the capability to troubleshoot quickly and effectively. In addition, ELECTROGLAS 4090 is compatible with a variety of different component probes, including active, passive, and ground-based probes. The prober can also be configured with a variety of software solutions, enabling automated, consistent tests. Moreover, the tool can analyze both single-ended and differential signals, further increasing the flexibility of its capabilities. In short, EG4090 is a versatile prober that is easy to configure, providing the user with a reliable, efficient tool for troubleshooting and testing small components. Its intuitive user interface and accompanying software provide the user with the capability to quickly and effectively analyze a wide range of signals. Its modular design and compatibility with a variety of probes make it an ideal choice for testing applications.