Used ELECTROGLAS / EG 4090 #293589322 for sale
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ID: 293589322
Prober
Commander version: DOS EGC 7.3.8
DCM Version: DCM 2
VM Alignment system
DPS Camera
Z-Stage: 0.25
Chuck material: Nickel
Chuck type: Hot
DPS Camera
Material handler module
Display control module
Prober control module
Vision module
OCR Camera
Bridge camera: COHU
1999 vintage.
ELECTROGLAS / EG 4090 Prober is a state-of-the-art parametric test solution, designed by EG, to provide high-precision probing and testing of semiconductor devices. The equipment is designed to provide efficient and reliable device validation, and is capable of testing devices featuring high TIV connections and packages. The system features a space-saving design, which allows the user to test a variety of devices with a single platform. It is equipped with electromagnetic probes that detect and react to the electrical properties of the devices, enabling high-precision testing. The unit is capable of testing components with high-current tester head, as well as dual-frequency tester head. The high-current tester head has an impressive power range that allows for tests of up to 500Vdc / 1Amp. As for the dual-frequency tester head, it includes both a DC and an AC frequency, allowing for dual-mode testing. EG 4090 Prober also includes an ergonomic parameter-infinite control machine, which allows for fast operation and providing near perfect test results. It integrates the latest semiconductor device technology with accurate and repeatable test results. Furthermore, the tool offers significant time savings in testing time, as it can test multiple devices simultaneously while also offering reliability, accuracy, and repeatability. The asset is compatible with different interfaces, such as IEEE, GPIB, and Ethernet, providing flexibility and a wide range of communication options. ELECTROGLAS EG4090 Prober is also designed to provide the highest safety standards during testing, which is ensured through its advanced safety features. These features include a series of safety interlock systems, overvoltage protection, and high-current protection circuits. Finally, the Model also comes with an extensive library of probing and testing applications that can be used to customize and optimize the test experience for specific types of devices. In addition, the equipment can also be adjusted and programmed from a remote workstation, allowing for convenient testing.
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