Used ELECTROGLAS / EG 4090 #293606420 for sale

Manufacturer
ELECTROGLAS / EG
Model
4090
ID: 293606420
Wafer Size: 6"-8"
Wafer prober, 6"-8" Standard chuck Ambient temperature.
ELECTROGLAS / EG 4090 is a innovatively designed prober technology developed to improve the accuracy and flexibility of automated probing operations for the semiconductor industry. EG 4090 is a multi-function non-contact probing equipment capable of measuring high-speed, high-dynamic-range signals with microsecond accuracy. The system features the most advanced technology available in prober technology today, allowing users to probe more than one circuit at a time. ELECTROGLAS EG4090 utilizes a number of different components capable of testing a variety of devices, such as dielectric and conductive substrates, unit-on-a-chip (SoC) designs, and multi-chip packages (MCP). The prober contains an integrated software package that enables the machine to perform thousands of measurements accurately and quickly. This software also has the ability to self-correct for discrepancies in signal measurements and has improved verification techniques for validating signal integrity. 4090 is the most compact model of EG family and does not require a large workspace. The prober uses a polishing station, a signal capture station and a bare-die test station integrated together within a small footprint. The tool is designed to be as responsive as possible with excellent signal-to-noise ratio, which allows users to control the signal dynamic range of their tests. The asset also features a high-speed dynamic signal measurement capability and offers a dynamic probing range of up to 200kHz. ELECTROGLAS / EG EG4090 also offers an exceptional yield analysis capability and high scalability, allowing it to fit into high-volume manufacturing processes. Its automated test cell and embedded software provide the instrument with high repeatability and maximum reproducibility. The monitoring and reporting axis provides the user with detailed feedback on the tests and evaluations. The prober interfaces with multiple test station robotic arms for faster probing and improved throughput. EG4090 is a comprehensive prober solution that is highly reliable and cost-effective. Its advanced technologies ensure accurate measurements and unparalleled flexibility and scalability within test environments. With its innovative design, ELECTROGLAS 4090 is an impressive piece of technological equipment ideal for any demanding semiconductor testing and probing needs.
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