Used ELECTROGLAS / EG 4090 #293606421 for sale

Manufacturer
ELECTROGLAS / EG
Model
4090
ID: 293606421
Wafer Size: 6"-8"
Wafer prober, 6"-8" OCR Standard chuck Ambient temperature.
ELECTROGLAS / EG 4090 Prober is a multi-purpose wafer prober that is used to test and characterize applications. It offers a wide range of capabilities and performance requirements in semiconductor, optoelectronic and other semiconductor device test applications. It features a modular design that allows flexible configurations to meet specific customer needs. The prober is used to measure electrical and optical characteristics of packaged semiconductor devices, as well as stand-alone integrated circuits (ICs) and components. It has a high throughput, making it suitable for automated wafer testing and probing. The prober is equipped with a closed-loop motion control equipment, which allows for fast and repeatable tests. EG 4090 system is equipped with an operator's console that provides a graphical user interface for operation. This console allows for direct communication with the prober and its integrated measurement unit. This machine has a built-in signal-processing capabilities, allowing for real-time manipulation of the test data. The prober's complete user interface allows for real-time control parameters, such as wafer movement and test speed. The prober supports a wide range of contact probes, such as adhesive-bonding and thermocouples. It is designed to be granular, allowing it to measure very small signals. The prober is also equipped with an automatic chuck tool, which allows for faster probing. The chuck and wheel asset can generate readings of up to 1 millimeter. Furthermore, ELECTROGLAS EG4090 provides multiple test algorithms, such as parametric and high-frequency response testing. It is capable of performing tests in all active areas of the IC, which helps ensure that the device is being tested in all areas, as opposed to just a few spots. EG EG4090 supports a number of post-test analysis functions, as well as an in-depth statistical analysis. The prober is equipped with a wide range of programming and control languages, allowing for easy program development. ELECTROGLAS / EG EG4090 prober is designed to be highly reliable and has a long life expectancy. The model has passed numerous reliability tests, making it suitable for permanent use in demanding semiconductor test applications. The prober's durable construction ensures that all components remain functional over time. Additionally, EG4090 is equipped with an upgradeable measurement equipment, allowing the user to extend the prober's capabilities to meet the customer's evolving needs.
There are no reviews yet