Used ELECTROGLAS / EG 4090 #293606437 for sale
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ID: 293606437
Wafer Size: 6"-8"
Wafer prober, 6"-8"
OCR
Standard chuck
Ambient temperature.
ELECTROGLAS / EG 4090 is a prober production test solution designed for automatic, high-speed and high-yield probing of semiconductor devices. It is capable of testing a wide variety of semiconductor devices from 8mil to 1mm pitch, and also supports high-density MEMS and optical elements. The prober has an automatic X-Y-Z stage which allows precise alignment between probes and the device under test. The Dual Arm Robotic Handler with Z Slider enables fast test cycles and can support a variety of multiple wafer-level probes and configurations. The equipment also features advanced user interface controls and a graphical analysis tool, allowing users to customize and efficiently manage their test configurations. The flat panel display platforms enable easy data viewing and analysis. EG 4090 uses a unique calibration system to monitor and adjust the X/Y/Z movement parameters of the prober, providing high-accuracy and repeatability during tests. The unit also utilizes advanced current monitoring to ensure efficient, reliable and accurate probing results. Additionally, an auto-diagonal function eliminates any misalignment errors, ensuring accurate probing and testing. The built-in dual arm robotic handler provides fast device handling and loading for both die-level and wafer-level testing. It also features a vacuum gripping machine which ensures secure wafer handling and high-speed testing. Finally, the prober is equipped with an Auto-Test status tool to monitor the testing process and troubleshoot with ease. Overall, ELECTROGLAS EG4090 prober is a major advancement in semiconductor device testing solutions, providing users with reliable, accurate and fast test cycles. It is capable of testing a wide range of devices and also offers an intuitive user interface that allows for efficient management of its test configurations.
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