Used ELECTROGLAS / EG 4090 #293606679 for sale

Manufacturer
ELECTROGLAS / EG
Model
4090
ID: 293606679
Wafer Size: 6"-8'
Prober, 6"-8' Standard chuck Ambient temperature.
ELECTROGLAS / EG 4090 is a prober designed specifically for high speed IC testing. It comes equipped with highly advanced features that can maximize production efficiency and minimize test time. The prober has a highly reliable positioning mechanism and a long stroke XYZ motion system, which allow the machine to accurately position the substrates to be tested, enabling it to reach high throughput capability. The probing speed of EG 4090 can reach up to ten thousand platen strokes per second, providing extremely fast probing of batches of ICs. Additionally, a maximum stroke limit of up to 8.3 inches can provide wide range platen coverage, enabling it to rapidly give results. The machine is also notable for its advanced motion control system. It can intelligently measure the platen motion and smoothly adjust the speed to ensure precision and accuracy in the testing process. High accuracy positioning technology can ensure error-free testing, and a specially designed probe with close loop rotation control delivers accurate notches and probes with repeatability on the wafer. It also maintains the ready-state with a minimum of time between platen cycle movements, allowing faster testing and higher throughput. Additionally, other control features of ELECTROGLAS EG4090 include test conditions auto-learning, self-adjustment and automatic operation. The machine is designed to perform fully automatic testing and calibration when the test conditions change. It also has an intuitive user interface to allow the user to easily customize and view results. The platform has a built-in database of pattern information, further aiding the accuracy and speed of testing. ELECTROGLAS / EG EG4090's advanced engineering helps increase the efficiency and accuracy of IC testing and development, allowing faster manufacturing times and higher quality products. It is an ideal tool for engineers and manufacturers seeking superior testing accuracy on a wide range of batch ICs.
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