Used ELECTROGLAS / EG 4090 #293615228 for sale

ELECTROGLAS / EG 4090
Manufacturer
ELECTROGLAS / EG
Model
4090
ID: 293615228
Prober.
ELECTROGLAS / EG 4090 Prober is a specialized machine used in semiconductor test and production applications. It enables testers to efficiently and accurately probe the electrical characteristics of microelectronic devices. EG 4090 Prober has a modular design, which provides flexibility in testing various types of devices. It consists of a central equipment and four independent workstations. The central system is equipped with a vacuum automation chamber, a vision unit, and a precision prober. The vacuum automation chamber is used to transfer wafers or individual devices from a test cassette to the ADEC prober. This is done by latching and transfer, to ensure accurate and precise sample alignment. The vacuum chamber also facilitates the supply of electrical signals and visual inspection of the wafers during the testing process. The vision machine is designed to deliver precise and repeatable probing results. It features high resolution image measurements, alignment features and a variable zoom capability. This tool is used for automated inspection and alignment of the samples before, during and after the probing process. The precision prober provides precise and repeatable electrical connections, with a minimum probing force of 0.3 grams. It is a highly sensitive and accurately calibrated device, capable of penetrating the most difficult geometries and materials. This ensures precise and reliable test results, with reduced testing time and cost. The four independent workstations are used to control the prober and its peripherals, such as the vision asset, the weighing model and the cassette adapter. The workstations are used to set up and monitor tests, analyze test results and generate detailed reports. ELECTROGLAS EG4090 Prober is a reliable and cost-effective device, suitable for a wide range of testing and production applications. It enables efficient and accurate probing of devices, and facilitates timely and accurate results to improve overall test throughput.
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