Used ELECTROGLAS / EG 4090 #293753143 for sale
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ID: 293753143
Prober
Non-functional
Temperature: 25-150°C
No monitor
No docking plate.
ELECTROGLAS / EG 4090 is a prober used for semiconductor device testing. It offers advanced automation, high accuracy, and high throughput for testing small form factor devices. This system utilizes a galvanometer-based scan sensor to rapidly measure the electrical characteristics of devices when used in a production setting. EG 4090 prober is designed for multi-site testing of devices. It uses a pair of x-y stages to automatically locate the device under test at multiple test sites and rapidly move from one site to another. This allows high throughput of multiple devices in a single test step. ELECTROGLAS EG4090 prober is flexible and can be adapted to test a variety of small form-factor devices, including vertically mountable devices. It can also be used to probe flat or tilted surface tests as well as flex-tilt and wrap test sites. The prober utilizes a pair of automated, independent, direct drive x-y stages for rapid, accurate alignment of the device under test at each measurement site. These stages offer high precision, repeatability, durability, and reliability in even the most demanding applications. In order to ensure accurate and reliable measurements, EG4090 prober utilizes several levels of automation. It includes a unique combination of automated x-y stage alignment, automatic contact height adjustment, and automatic lead compensation. This ensures the device under test is always accurately and reliably measured. ELECTROGLAS / EG EG4090 prober also utilizes galvanometer-based scan technology for rapid measurements of parametric device parameters. This tool is able to extract an entire drain-source resistance curve which is important for evaluating transistors, diodes, and parametric device measurements. ELECTROGLAS 4090 prober is also equipped with optional vacuum chuck and static chuck modules. The vacuum chuck is especially useful when testing wafers or other large chip assemblies, while the static chuck module can be used for repeatable and reliable test of small parts and components. Overall, EG EG4090 prober is an extremely versatile prober for testing everything from small-scale devices to large-scale chip assemblies. It combines high accuracy, repeatability, and flexibility with several levels of automation for fast, reliable, and accurate measurements.
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